Memory self-test static grouping method and device

The invention provides a memory self-test static grouping method and device, and the method comprises the steps: determining the test cost of each memory through a preset memory test cost algorithm when a memory static grouping instruction is received; sorting the memories according to a sequence of the test cost from high to low to obtain a memory sequence; and according to a predetermined grouping method, sequentially dividing a plurality of adjacent memories in the sequence into the same group. After grouping, the memories can be tested according to groups, and the test times can be correspondingly planned for the memory groups with different test costs, so that the test efficiency of the memories can be improved, and the total test cost can be reduced. 本申请提供一种存储器自测试静态分组方法及装置，该方法包括：当接收到存储器静态分组指令时，通过预定的存储器测试成本算法确定各存储器的测试成本；按照测试成本从大到小的顺序，对各存储器进行排序，得到存储器序列；按照预定的分组方法，依次将序列中相邻的多个存储器分为同组。本申请通过分组后，可以对存储器进行按组测试，对于不同测试成本的存储器组可以相应地规划测试次数，从而可以提高存储器的测试效率，降低测试总成本。