Memristor multi-mode operation test circuit and test method

The invention relates to a memristor multi-mode operation test circuit and a test method, and the test circuit is composed of a pulse generation card, an array card and a signal acquisition card, and the array card is used for directly realizing the carrying of different memristor arrays to be tested. When a memristor array to be tested is subjected to a multi-working-mode test, the memristor array can be configured to be in a single-device reading mode, a single-device forward writing mode or a single-device reverse writing mode by using an upper computer through a pulse generation card, and a signal acquisition card is configured to acquire signals in a corresponding test mode; after the upper computer starts a trigger test, the pulse generation card sends corresponding read-write pulses and grid voltage control pulses to a selected test area in the memristor array, and the signal acquisition card acquires a measurement signal of the selected test area and transmits the measurement signal to the upper compu