Additive manufacturing quality detection method and related device

The invention discloses an additive manufacturing quality detection method and a related device. The method comprises the steps that an industrial control computer obtains a first electric signal corresponding to a light emitting signal, a second electric signal corresponding to a laser reflection s...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG LIN, WANG MINGLANG, YOU DEYONG, YUAN PENG, BAI TIANXIANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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