Additive manufacturing quality detection method and related device
The invention discloses an additive manufacturing quality detection method and a related device. The method comprises the steps that an industrial control computer obtains a first electric signal corresponding to a light emitting signal, a second electric signal corresponding to a laser reflection s...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an additive manufacturing quality detection method and a related device. The method comprises the steps that an industrial control computer obtains a first electric signal corresponding to a light emitting signal, a second electric signal corresponding to a laser reflection signal, a third electric signal corresponding to a visible light signal and a fourth electric signal corresponding to an infrared light signal in a first time period in the laser additive manufacturing process; the industrial control computer determines a layer electric signal amplitude corresponding to at least one of the light signal, the laser reflection signal, the visible light signal and the infrared light signal according to at least one of the first electric signal, the second electric signal, the third electric signal and the fourth electric signal in the first time period; and determining whether the target slice layer has defects or not based on at least one of the layer electric signal amplitude correspo |
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