Water vapor plasma for enhanced surface hydrophilicity

Methods and apparatus for processing a region of a substrate are provided herein. For example, a method for enhancing surface hydrophilicity on a substrate includes: a) supplying a water vapor plasma to a processing volume of a plasma processing chamber using a remote plasma source to treat a bondin...

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Hauptverfasser: XU YUANHUI, BERGMAN, ERIC, J, MUHAMMAD HILEMISIK NAGY YASIR ABDUL AZIZ, SUDIONO, JOHN, L, SUNDARRAJAN ARVIND, NG YEE KOK KAM, LIANTO PRAYUDI, THAMUGANATHAN, VASUDEVAN, PAPANU JAMES S, YOUNG WILLIAM YIU DUNCAN, LIN YINWEI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:Methods and apparatus for processing a region of a substrate are provided herein. For example, a method for enhancing surface hydrophilicity on a substrate includes: a) supplying a water vapor plasma to a processing volume of a plasma processing chamber using a remote plasma source to treat a bonding surface of the substrate, b) supplying at least one of microwave power or RF power to the plasma processing chamber at a frequency of from about 1 kHz to 10 GHz and a power of from about 1 kW to 10 kW to maintain a water vapor plasma within the processing volume during operation, and c) continuing a) and b) until the bonding surface of the substrate has a hydrophilic contact angle of less than 10 DEG. 本文提供用于处理基板区的方法和装置。例如,一种用于在基板上增强表面亲水性的方法包括:a)使用远程等离子体源,将水蒸气等离子体供应至等离子体处理腔室的处理容积,以处置基板的接合表面,b)以从约1kHz至10GHz的频率和从约1kW至10kW的功率将微波功率或RF功率中的至少一者供应至等离子体处理腔室,以在操作期间在处理容积内维持水蒸气等离子体,以及c)持续a)和b)直到基板的接合表面具有小于10°的亲水接触角度为止。