Yield rate multi-dimensional interaction system and method, computer equipment and storage medium

The invention relates to a yield multi-dimensional interaction system and method, computer equipment and a storage medium. The system comprises a processing engine which is used for receiving an input for describing a chip yield problem, carrying out analysis processing based on the input and then c...

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Bibliographische Detailangaben
Hauptverfasser: LIU RENHE, CHEN BIMEI, LU MEIJUN, ZHANG GUANGCHAO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a yield multi-dimensional interaction system and method, computer equipment and a storage medium. The system comprises a processing engine which is used for receiving an input for describing a chip yield problem, carrying out analysis processing based on the input and then carrying out feedback output; the processing engine carries out analysis processing based on the input and then carries out feedback output, and the method comprises the following steps: generating a result of the chip yield problem for output based on a knowledge database module and/or a chip yield analysis module coupled with the processing engine by using input information about a plurality of data dimensions describing the chip yield problem; the knowledge database module is used for generating a result of a chip yield problem based on data pre-stored in a knowledge database; and the chip yield analysis module is used for analyzing the input information of the plurality of data dimensions in real time to generat