Method for detecting abnormity of water channel of semiconductor chip high and low temperature test system

The invention discloses a semiconductor chip high and low temperature test system water channel abnormity detection method comprising the following steps: S1, arranging a temperature sensor at a water outlet of a multi-flow-channel water cooling heat exchanger, and monitoring the temperature change...

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Bibliographische Detailangaben
Hauptverfasser:	WANG JIE, LIU JUN, LI SHIYU, LI XIANFEI, TAO XIANGQIAN, TU YUNLONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BLASTING COMBINED HEATING AND REFRIGERATION SYSTEMS DETAILS OF HEAT-EXCHANGE AND HEAT-TRANSFER APPARATUS, OFGENERAL APPLICATION HEAT EXCHANGE IN GENERAL HEAT PUMP SYSTEMS HEATING LIGHTING LIQUEFACTION SOLIDIFICATION OF GASES MANUFACTURE OR STORAGE OF ICE MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE MECHANICAL ENGINEERING PHYSICS REFRIGERATION MACHINES, PLANTS OR SYSTEMS REFRIGERATION OR COOLING TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR WEAPONS
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