Method for detecting abnormity of water channel of semiconductor chip high and low temperature test system

The invention discloses a semiconductor chip high and low temperature test system water channel abnormity detection method comprising the following steps: S1, arranging a temperature sensor at a water outlet of a multi-flow-channel water cooling heat exchanger, and monitoring the temperature change of the surface of the multi-flow-channel water cooling heat exchanger in real time; s2, reading the temperature of the temperature sensor through the control screen, and recording and taking the temperature as an initial basic temperature value T1; and S3, recording a temperature change curve according to ordinary test and empirical values, calculating an average value and a standard deviation of the temperature of the multi-runner water-cooling heat exchanger, and giving a temperature deviation value T2. The temperature of the multi-flow-channel water-cooling heat exchanger can be monitored in real time, the working condition state of the multi-flow-channel water-cooling heat exchanger is judged through the temper