Method for detecting abnormity of water channel of semiconductor chip high and low temperature test system
The invention discloses a semiconductor chip high and low temperature test system water channel abnormity detection method comprising the following steps: S1, arranging a temperature sensor at a water outlet of a multi-flow-channel water cooling heat exchanger, and monitoring the temperature change...
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| creator | WANG JIE LIU JUN LI SHIYU LI XIANFEI TAO XIANGQIAN TU YUNLONG |
| description | The invention discloses a semiconductor chip high and low temperature test system water channel abnormity detection method comprising the following steps: S1, arranging a temperature sensor at a water outlet of a multi-flow-channel water cooling heat exchanger, and monitoring the temperature change of the surface of the multi-flow-channel water cooling heat exchanger in real time; s2, reading the temperature of the temperature sensor through the control screen, and recording and taking the temperature as an initial basic temperature value T1; and S3, recording a temperature change curve according to ordinary test and empirical values, calculating an average value and a standard deviation of the temperature of the multi-runner water-cooling heat exchanger, and giving a temperature deviation value T2. The temperature of the multi-flow-channel water-cooling heat exchanger can be monitored in real time, the working condition state of the multi-flow-channel water-cooling heat exchanger is judged through the temper |
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| subjects | BLASTING COMBINED HEATING AND REFRIGERATION SYSTEMS DETAILS OF HEAT-EXCHANGE AND HEAT-TRANSFER APPARATUS, OFGENERAL APPLICATION HEAT EXCHANGE IN GENERAL HEAT PUMP SYSTEMS HEATING LIGHTING LIQUEFACTION SOLIDIFICATION OF GASES MANUFACTURE OR STORAGE OF ICE MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE MECHANICAL ENGINEERING PHYSICS REFRIGERATION MACHINES, PLANTS OR SYSTEMS REFRIGERATION OR COOLING TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR WEAPONS |
| title | Method for detecting abnormity of water channel of semiconductor chip high and low temperature test system |
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