Application test method and device, electronic equipment and storage medium
The invention relates to an application test method and device, electronic equipment and a storage medium, and the method comprises the steps: determining target function address information corresponding to a target interrupt function from a first to-be-called function under the condition of receiv...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to an application test method and device, electronic equipment and a storage medium, and the method comprises the steps: determining target function address information corresponding to a target interrupt function from a first to-be-called function under the condition of receiving a service test request, writing the target function address information into a preset function modification tool, and modifying the target interrupt function according to the target function address information; sending a first service processing request to a target application based on a request sending tool, obtaining first function address information under the condition that a preset function modification tool detects a first function call instruction, and sending the first service processing request to the target application under the condition that the first function address information is matched with the target function address information; and executing a preset abnormal interrupt operation on the targ |
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