Rapid sample positioning method for terahertz near-field imaging system

The invention discloses a rapid sample positioning method for a terahertz near-field imaging system, belongs to the field of terahertz near-field imaging, and mainly solves the problems of difficult and slow sample positioning in use of the terahertz near-field imaging system. A high-magnification image under an external high-precision optical microscope is adopted, and rapid positioning of a sample is ensured by utilizing a three-step method of feature image selection, feature image recognition and sample positioning. The problem of rapid positioning of a terahertz near-field imaging system sample is solved, and the positioning time is shortened from an hour level to a minute level. The method has the characteristics of simplicity and rapidness in operation. 一种太赫兹近场成像系统样品快速定位方法，属于太赫兹近场成像领域，主要解决太赫兹近场成像系统使用中对样品定位难、定位慢的问题。采取外部高精度的光学显微镜下高倍数的成像图，利用特征图像的选取、特征图像的识别、样品的定位三步法保证样品的快速定位。解决太赫兹近场成像系统样品快速定位的问题，定位时间从小时级别缩短至分钟量级。本方法具有操作简单、快速的特点。