Display chip detection method and device, electronic equipment, system and storage medium

The invention is suitable for the technical field of display, and provides a display chip detection method and device, electronic equipment, a system and a storage medium, the method comprises the steps that a first interface is displayed on a first display screen, and the first interface comprises...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TANG SHENFU, ZHANG MENGYING, BAI SHENGWU
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention is suitable for the technical field of display, and provides a display chip detection method and device, electronic equipment, a system and a storage medium, the method comprises the steps that a first interface is displayed on a first display screen, and the first interface comprises a first control; in response to a first operation for the first control, performing defect detection on the first display chip to obtain defect information of the first display chip; the defect information of the first display chip is displayed on the second display screen, and the defect information of the first display chip comprises defect statistical information corresponding to the first display chip, unit distribution information of the first display chip and defect information of each display unit in a plurality of display units included in the first display chip. According to the scheme, the display dimension of the defect data can be expanded, and a user can quickly position the defect conveniently. 本申请适用于