Film system modulation type calculation imaging spectrometer-oriented calibration method and calibration data processing method
The invention discloses a calibration method for a film system modulation type calculation imaging spectrometer and a calibration data processing method, relates to an imaging spectrometer calibration technology, and solves the problems that an existing spectrometer calibration method has defects, a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a calibration method for a film system modulation type calculation imaging spectrometer and a calibration data processing method, relates to an imaging spectrometer calibration technology, and solves the problems that an existing spectrometer calibration method has defects, and a data processing and acquisition process is lack of reference and complex. By adjusting the two-dimensional inclined table, the light spot is controlled to move horizontally, and the imaging line scanned by the light spot is adjusted; by controlling the rotary table mechanism, the circular light spots are gradually scanned in the imaging breadth direction; the PC controls the monochromator to output monochromatic light in a scanning stepping mode; after monochromatic light output for one time is stable, the PC controls the camera to perform exposure imaging acquisition for multiple times; when full-spectrum scanning and data acquisition are completed at a single position, the two-dimensional inclined table is c |
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