Method for testing fast charging performance of negative electrode material
The invention provides a method for testing the fast charging performance of a negative electrode material, and the method comprises the steps: S1, making a negative electrode material to be detected into a negative electrode plate, and making the negative electrode plate into a button type half cel...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a method for testing the fast charging performance of a negative electrode material, and the method comprises the steps: S1, making a negative electrode material to be detected into a negative electrode plate, and making the negative electrode plate into a button type half cell; s2, circularly activating the button type half cell to obtain an activated half cell; s3, the activated half cell is discharged at a first multiplying power and a second multiplying power respectively, charging is carried out between two times of discharging, the discharging gram capacity of the activated half cell at the first multiplying power and the second multiplying power is tested, the first multiplying power is smaller than the second multiplying power, and the difference value of the first multiplying power and the second multiplying power is larger than or equal to 0.5 C; and S4, calculating the ratio of the discharge gram capacity under the second multiplying power to the discharge gram capacity under |
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