MEASUREMENT DEVICE AND MEASUREMENT METHOD
The invention relates to the technical field of measurement, in the embodiment of the invention, a measuring device at least comprises a measuring piece and a light blocking structure, and the light blocking structure comprises a main body piece, optical cement and a light blocking piece. By arrangi...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of measurement, in the embodiment of the invention, a measuring device at least comprises a measuring piece and a light blocking structure, and the light blocking structure comprises a main body piece, optical cement and a light blocking piece. By arranging the light blocking structure used in cooperation with the measuring piece and configuring the refractive index of the optical cement to be the same as the refractive index of the substrate of the film coating piece, interface reflection generated by the surface of the side, deviating from the film coating layer, of the substrate can be eliminated, and under the condition that measuring light emitted by the measuring piece can reach the optical cement after sequentially passing through the film coating layer and the substrate, the measuring accuracy is improved. The light blocking part is used for blocking the light entering the optical cement from being reflected to the substrate, so that the measuring part can |
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