Probe head

A cylindrical part and an inclined truncation part of the probe head are inclined downwards and face high-power electronic equipment to be tested. The probe head has a proximal end including an obliquely truncated conical portion inclined at an input angle relative to the longitudinal axis, and an a...

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Hauptverfasser: HILDENHAGEN PETER, STEVENS MICHAEL D, UBER MICHAEL, BOOMAN RICHARD, MENDE MICHAEL J, PODREBECEK, THOMAS, TRUELLE, J ¨ 1 RGEN, KLEIN KAI, ZIMMERMANN IRIS, PANNES FRANK, RAAPERI, NADJA, PARFI-DAWN-SELLE PHILIPPE, MENDE MATTHEW M, HEYMAN MARK, FRABASILE, NICHOLAS, WERBER, URI, ENGELS MICHAEL, JACOBS BENNO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A cylindrical part and an inclined truncation part of the probe head are inclined downwards and face high-power electronic equipment to be tested. The probe head has a proximal end including an obliquely truncated conical portion inclined at an input angle relative to the longitudinal axis, and an analog signal input end. The probe head is provided with a digital signal output end which is arranged at the far end of the shell. 一种探针头,其圆柱形部分和斜截断部分向下倾斜,朝向待测的大功率电子设备。探针头有一个邻近端,包括一个相对于纵轴以输入角度倾斜的斜截断圆锥部分,并有一个模拟信号输入端。探针头有一个数字信号输出端,提供在外壳的远端。