Surface defect detection method and system based on ultrasonic and visual inspection
The invention discloses a surface defect detection method and system based on ultrasonic wave and visual inspection, and relates to the technical field of defect detection, and the surface defect detection method based on ultrasonic wave and visual inspection is matched with the surface defect detec...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a surface defect detection method and system based on ultrasonic wave and visual inspection, and relates to the technical field of defect detection, and the surface defect detection method based on ultrasonic wave and visual inspection is matched with the surface defect detection method based on ultrasonic wave and visual inspection. According to the method, the area where the surface defects possibly exist is obtained based on the ultrasonic detection technology, then the visual detection technology is used for checking the area so as to confirm whether the area has the surface defects or not, and then the detection accuracy is improved based on double detection of the ultrasonic detection technology and the visual detection technology. According to the method, the surface defect detection is performed on the area with the surface defect, so that the type, the size, the shape and the like of the surface defect can be further determined, an accurate data basis is provided for subsequen |
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