Device and method for examining and testing high temperature of open circuit of 200 DEG C and above

The invention relates to a device and a method for examining and testing the high temperature of an open circuit at 200 DEG C and above, the device comprises a plurality of unit cylinders, each unit cylinder comprises a cylinder body with an open bottom surface and an open top surface, the side surface of each cylinder body is provided with one or more windows, and each window is provided with a window door for controlling the opening and closing of the window; the unit barrels are combined and arranged together to form a whole, and the windows in every two adjacent barrels correspond to each other. The high-temperature examination testing device for the open circuit at the temperature of 200 DEG C or above mainly comprises the unit barrel, opening and closing of the heat dissipation channel can be controlled through the window and the door on the barrel body, adjustment can be carried out according to the sizes of different circuit boards and the sizes and the layout of functional units in a circuit system,