Electrical testing jig
The invention discloses an electrical testing jig which comprises a pressing column located above a product rivet and spring PINs located below the product rivet, the spring PINs comprise the upper spring PINs, the middle spring PINs and the lower spring PINs, the distance between the upper spring P...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an electrical testing jig which comprises a pressing column located above a product rivet and spring PINs located below the product rivet, the spring PINs comprise the upper spring PINs, the middle spring PINs and the lower spring PINs, the distance between the upper spring PINs and the middle spring PINs is a first distance, and the distance between the lower spring PINs and the middle spring PINs is a second distance. The distance between the middle spring PIN needle and the lower spring PIN needle is a second distance, the pressing column presses the product rivet downwards, the product rivet presses the upper spring PIN needle downwards, and the difference value between the descending distance of the upper spring PIN needle and the first distance is the maximum upper deviation of the rivet length. And the difference between the sum of the first spacing and the second spacing and the descending distance of the upper spring PIN needle is the maximum lower deviation of the length of t |
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