Extremely low voltage I/O circuit and defect screening method
The invention relates to a very low voltage I/O circuit and a defect screening method. A GPIO includes: a transmitter having an output stage connected to an I/O pad and adapted to supply transmission data to the I/O pad for a transmission operation in response to output data generated by low-voltage...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a very low voltage I/O circuit and a defect screening method. A GPIO includes: a transmitter having an output stage connected to an I/O pad and adapted to supply transmission data to the I/O pad for a transmission operation in response to output data generated by low-voltage core logic operating within a functional voltage range; a receiver suitable for supplying receive data to the low voltage core logic operating within the functional voltage range for a receive operation in response to input data received at the I/O pad; a VLV transmitter adapted to supply VLV transmit data to the output stage of the transmitter, rather than directly to the I/O pad, in response to output test data generated by the low voltage core logic; and a VLV receiver adapted to supply VLV receive data to the low voltage core logic operating within a low core power supply voltage range in response to input data received from the output stage of the transmitter.
本公开涉及极低电压I/O电路和缺陷筛选方法。一种GPIO包括:发送器,具有连接到I/O垫的输出级并 |
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