Electronic component testing device and method
The invention discloses an electronic component testing device and method, and belongs to the technical field of electronic component test.The electronic component testing device comprises a rack, a feeding table and a conveying belt are arranged above the rack, the feeding table is used for transfe...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an electronic component testing device and method, and belongs to the technical field of electronic component test.The electronic component testing device comprises a rack, a feeding table and a conveying belt are arranged above the rack, the feeding table is used for transferring a to-be-tested component to the conveying belt, the conveying belt is provided with a detection area, the detection area is provided with a detector and a clamping assembly, and the clamping assembly comprises a positioning groove body; a detection opening is formed in one side of the positioning groove body, and the detection opening and the detector are oppositely arranged; a movable push rod is arranged on the other side of the positioning groove body, and the movable tail end of the movable push rod is opposite to the detection opening; the movable push rod moves back and forth to fix and release the to-be-tested element; a buffer piece is arranged at the movable tail end of the movable push rod and used |
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