Image sensor structure and method for obtaining highlight overflow
An image sensor structure and a method of obtaining highlight overflow, the method comprising: providing an image sensor structure, the image sensor structure comprising pixel units, each pixel unit comprising a plurality of adjacent pixel structures; wherein a plurality of pixel structures in the p...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | An image sensor structure and a method of obtaining highlight overflow, the method comprising: providing an image sensor structure, the image sensor structure comprising pixel units, each pixel unit comprising a plurality of adjacent pixel structures; wherein a plurality of pixel structures in the pixel unit share a transmission drain electrode, and the pixel unit comprises a first pixel structure and a second pixel structure which are adjacent to each other; obtaining a first condition current of an N-type region of the first pixel structure and a second condition current of a reset drain electrode under a first condition and a second condition respectively; and obtaining the performance of highlight overflow based on the relative magnitude between the first condition current and the second condition current under the first condition and the second condition. According to the embodiment of the invention, the comprehensiveness and accuracy of highlight overflow performance evaluation are improved.
一种图像传感器结构以及 |
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