SYSTEM AND METHOD FOR TRANSFERRING SAMPLE

Systems and methods for transferring a sample from a transmission electron microscope (TEM) column are described herein. In one aspect, a method may include transferring a sample positioned in a holder enclosure of a TEM sample holder from a vacuum chamber of a TEM into a load lock of the TEM; filli...

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Bibliographische Detailangaben
Hauptverfasser: BISCHOFF MICHAEL, SCHANER, ODILE, L
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:Systems and methods for transferring a sample from a transmission electron microscope (TEM) column are described herein. In one aspect, a method may include transferring a sample positioned in a holder enclosure of a TEM sample holder from a vacuum chamber of a TEM into a load lock of the TEM; filling the load lock with a protective gas; the retainer enclosure is used for sealing the TEM sample retainer under the shielding gas; and removing the TEM sample holder from the load lock. 本文描述了用于从透射电子显微镜(TEM)柱转移样本的系统和方法。在一个方面中,一种方法可包括:将定位在TEM样本保持器的保持器封壳中的样本从TEM的真空腔室转移到该TEM的负载锁中;用保护气体填充该负载锁;在该保护气体下密封该TEM样本保持器的该保持器封壳;以及从该负载锁移除该TEM样本保持器。