Hatch bulk grain surface layer intelligent checking and sampling suit device and checking and sampling method of hatch bulk grain surface layer intelligent checking and sampling suit device
The invention provides a hatch bulk grain surface layer intelligent checking and sampling suit device and a checking and sampling method. The hatch bulk grain surface layer intelligent checking and sampling suit device comprises a suit structure frame, a hatch camera shooting and size measuring unit...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a hatch bulk grain surface layer intelligent checking and sampling suit device and a checking and sampling method. The hatch bulk grain surface layer intelligent checking and sampling suit device comprises a suit structure frame, a hatch camera shooting and size measuring unit, an approaching distance measuring and micro-distance photographing unit, a large target object and small target object intelligent detection unit, a cutting sampling unit, a sample material collecting unit, a communication module and antenna group, a power supply lighting unit, an industrial personal computer and device working state display unit and a sampling record printer are integrated in the suit structure frame. And a suspension bracket, an antenna, a warning lamp, an antenna network covering a working area, a ground portable terminal, a ground workstation algorithm server and a remote monitoring terminal are assembled outside the suit structure frame. Through the technical scheme of the invention, the sam |
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