Rapid evaluation method for shielding degree of stains on surface of photovoltaic module
The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying...
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| creator | DAI SUI |
| description | The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying out the preprocessing of the data; (2) confirming the hyperspectral data of the dirty sample, and confirming the pollution type; (3) calculating the surface stain shielding rate of the crystalline silicon photovoltaic power station module; (4) constructing a database; and (5) adopting an unmanned aerial vehicle to carry a hyperspectral image acquisition system outdoors to acquire hyperspectral data after the to-be-detected crystalline silicon photovoltaic module is dirty, obtaining the surface stain shielding rate of the to-be-detected crystalline silicon photovoltaic module according to the constructed database, and further obtaining the surface stain shielding degree of the to-be-detected crystalline silicon pho |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117783004A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117783004A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117783004A3</originalsourceid><addsrcrecordid>eNqNi0EKwjAQRbtxIeodxgMILRXqthTFlQtx4a4MzaQJpJmQSXp-g3gAVx_ee39bvZ8YrAJa0WVMlj0slAwr0BxBjCWnrJ9B0RyJgDVIQusFSig5apy-MBhOvLIrboKFVXa0rzYandDht7vqeLu-hvuJAo8koTw9pXF4NE3XXdq6PvftP80HsMY6dA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Rapid evaluation method for shielding degree of stains on surface of photovoltaic module</title><source>esp@cenet</source><creator>DAI SUI</creator><creatorcontrib>DAI SUI</creatorcontrib><description>The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying out the preprocessing of the data; (2) confirming the hyperspectral data of the dirty sample, and confirming the pollution type; (3) calculating the surface stain shielding rate of the crystalline silicon photovoltaic power station module; (4) constructing a database; and (5) adopting an unmanned aerial vehicle to carry a hyperspectral image acquisition system outdoors to acquire hyperspectral data after the to-be-detected crystalline silicon photovoltaic module is dirty, obtaining the surface stain shielding rate of the to-be-detected crystalline silicon photovoltaic module according to the constructed database, and further obtaining the surface stain shielding degree of the to-be-detected crystalline silicon pho</description><language>chi ; eng</language><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; ELECTRICITY ; GENERATION ; GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240329&DB=EPODOC&CC=CN&NR=117783004A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240329&DB=EPODOC&CC=CN&NR=117783004A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DAI SUI</creatorcontrib><title>Rapid evaluation method for shielding degree of stains on surface of photovoltaic module</title><description>The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying out the preprocessing of the data; (2) confirming the hyperspectral data of the dirty sample, and confirming the pollution type; (3) calculating the surface stain shielding rate of the crystalline silicon photovoltaic power station module; (4) constructing a database; and (5) adopting an unmanned aerial vehicle to carry a hyperspectral image acquisition system outdoors to acquire hyperspectral data after the to-be-detected crystalline silicon photovoltaic module is dirty, obtaining the surface stain shielding rate of the to-be-detected crystalline silicon photovoltaic module according to the constructed database, and further obtaining the surface stain shielding degree of the to-be-detected crystalline silicon pho</description><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0EKwjAQRbtxIeodxgMILRXqthTFlQtx4a4MzaQJpJmQSXp-g3gAVx_ee39bvZ8YrAJa0WVMlj0slAwr0BxBjCWnrJ9B0RyJgDVIQusFSig5apy-MBhOvLIrboKFVXa0rzYandDht7vqeLu-hvuJAo8koTw9pXF4NE3XXdq6PvftP80HsMY6dA</recordid><startdate>20240329</startdate><enddate>20240329</enddate><creator>DAI SUI</creator><scope>EVB</scope></search><sort><creationdate>20240329</creationdate><title>Rapid evaluation method for shielding degree of stains on surface of photovoltaic module</title><author>DAI SUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117783004A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DAI SUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DAI SUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Rapid evaluation method for shielding degree of stains on surface of photovoltaic module</title><date>2024-03-29</date><risdate>2024</risdate><abstract>The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying out the preprocessing of the data; (2) confirming the hyperspectral data of the dirty sample, and confirming the pollution type; (3) calculating the surface stain shielding rate of the crystalline silicon photovoltaic power station module; (4) constructing a database; and (5) adopting an unmanned aerial vehicle to carry a hyperspectral image acquisition system outdoors to acquire hyperspectral data after the to-be-detected crystalline silicon photovoltaic module is dirty, obtaining the surface stain shielding rate of the to-be-detected crystalline silicon photovoltaic module according to the constructed database, and further obtaining the surface stain shielding degree of the to-be-detected crystalline silicon pho</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Rapid evaluation method for shielding degree of stains on surface of photovoltaic module |
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