Rapid evaluation method for shielding degree of stains on surface of photovoltaic module

The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying...

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1. Verfasser: DAI SUI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method for rapidly evaluating the shielding degree of stains on the surface of a photovoltaic module, and the method comprises the following steps: (1) collecting hyperspectral data of a dirty and cleaned crystalline silicon photovoltaic module in a laboratory, and carrying out the preprocessing of the data; (2) confirming the hyperspectral data of the dirty sample, and confirming the pollution type; (3) calculating the surface stain shielding rate of the crystalline silicon photovoltaic power station module; (4) constructing a database; and (5) adopting an unmanned aerial vehicle to carry a hyperspectral image acquisition system outdoors to acquire hyperspectral data after the to-be-detected crystalline silicon photovoltaic module is dirty, obtaining the surface stain shielding rate of the to-be-detected crystalline silicon photovoltaic module according to the constructed database, and further obtaining the surface stain shielding degree of the to-be-detected crystalline silicon pho