Two-dimensional line profile tolerance measurement method, device and system and storage medium

The invention discloses a two-dimensional line profile tolerance measurement method, device and system and a storage medium. The method comprises the following steps: after collecting measurement contour data information of a to-be-measured product and converting the measurement contour data information into a corresponding measurement contour for display, setting a plurality of measurement points on the measurement contour according to a preset point taking rule, and aligning the measurement contour with a theoretical contour according to a theoretical contour and a measurement reference mode of the to-be-measured product; calculating the profile tolerance of the to-be-measured product according to the current coordinate information of the plurality of measuring points and the theoretical profile; therefore, the technical problems of low measurement efficiency and poor real-time performance when the two-dimensional line profile tolerance of the to-be-measured product is measured in the prior art are solved.