System and method for aging test of system packaging device

The invention belongs to the technical field of aging testing, particularly relates to a system and method for aging testing of a system-in-package device, and aims to solve the problems that the aging testing result of the system-in-package device is inaccurate and has deviation. The system comprises an aging test module, a temperature control module, a data processing module and a system control module. The system control module is used for sending out a control signal according to an externally input task instruction and obtaining a judgment result; the aging test module is used for sending a digital signal and/or an analog signal according to the aging test module control signal, and obtaining test feedback data sent by the device to be tested; the temperature control module is used for receiving a control signal of the temperature control module and the environment temperature of the system-in-package device to be aged and tested, which is acquired in real time; and the data processing module is used for