Despeckling in optical measurement systems

The invention relates to speckle removal in an optical measurement system. Embodiments relate to optical measurement systems that utilize multiple emitters to emit light during measurements, and methods of performing measurements using these optical measurement systems. The optical measurement syste...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GALE DAVID S, GREENING TODD C, ABEL, MICHAEL, A, SZUGERBECK, ANDREW, F, PELTS, JOHN, S, TERRELL MATTHEW A
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to speckle removal in an optical measurement system. Embodiments relate to optical measurement systems that utilize multiple emitters to emit light during measurements, and methods of performing measurements using these optical measurement systems. The optical measurement system may include: a light generating assembly configured to generate light via a light source unit; and a photonic integrated circuit, the photonic integrated circuit including an emission group, the emission group having a plurality of emitters. Each of the emitters is optically coupled to the light generating component to receive light generated from the light generating component and may emit the light from a surface of the photonic integrated circuit. The optical measurement system may perform measurements in which the light generating component generates light and each of the plurality of emitters simultaneously emits light received from the light generating component. 本公开涉及光学测量系统中的去斑。实施方案涉及在测量期间利用多个发射器来发射光的光学测量系