Test system and method of analog-to-digital converter and electronic equipment

The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. Th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: QIAN YU, ZHENG SHAOLIANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!