Test system and method of analog-to-digital converter and electronic equipment

The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. Th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: QIAN YU, ZHENG SHAOLIANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. The automatic test module is used for electrifying the to-be-tested chip and configuring the to-be-tested chip to enter an analog-to-digital converter working mode; the automatic test module is used for driving the automatic test module to send a preset waveform to the input port of the analog-to-digital converter; the to-be-tested chip is used for converting the analog signal input by the automatic test module into a digital signal and outputting the digital signal from a digital pin of the to-be-tested chip after the analog-to-digital converter is in a working state; the automatic test module is used for collecting and storing an output signal of the chip to be tested; and the automatic test module is used for reco