Test system and method of analog-to-digital converter and electronic equipment
The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. Th...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | QIAN YU ZHENG SHAOLIANG |
description | The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. The automatic test module is used for electrifying the to-be-tested chip and configuring the to-be-tested chip to enter an analog-to-digital converter working mode; the automatic test module is used for driving the automatic test module to send a preset waveform to the input port of the analog-to-digital converter; the to-be-tested chip is used for converting the analog signal input by the automatic test module into a digital signal and outputting the digital signal from a digital pin of the to-be-tested chip after the analog-to-digital converter is in a working state; the automatic test module is used for collecting and storing an output signal of the chip to be tested; and the automatic test module is used for reco |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117749179A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117749179A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117749179A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAURuEsDqK-Q3yADEEhdJSiOHXqXkLytwaS3JhcBd9eER_A6XDgW4thRGPZXo2RpM1eJvCNvKT5czbSopiUD0tgG6Wj_ERl1K9EhONKOTiJ-yOUhMxbsZptbNj9uhH7y3nsrwqFJrRiHTJ46getjTl22nSnwz_mDSGbNtc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test system and method of analog-to-digital converter and electronic equipment</title><source>esp@cenet</source><creator>QIAN YU ; ZHENG SHAOLIANG</creator><creatorcontrib>QIAN YU ; ZHENG SHAOLIANG</creatorcontrib><description>The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. The automatic test module is used for electrifying the to-be-tested chip and configuring the to-be-tested chip to enter an analog-to-digital converter working mode; the automatic test module is used for driving the automatic test module to send a preset waveform to the input port of the analog-to-digital converter; the to-be-tested chip is used for converting the analog signal input by the automatic test module into a digital signal and outputting the digital signal from a digital pin of the to-be-tested chip after the analog-to-digital converter is in a working state; the automatic test module is used for collecting and storing an output signal of the chip to be tested; and the automatic test module is used for reco</description><language>chi ; eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240322&DB=EPODOC&CC=CN&NR=117749179A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240322&DB=EPODOC&CC=CN&NR=117749179A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>QIAN YU</creatorcontrib><creatorcontrib>ZHENG SHAOLIANG</creatorcontrib><title>Test system and method of analog-to-digital converter and electronic equipment</title><description>The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. The automatic test module is used for electrifying the to-be-tested chip and configuring the to-be-tested chip to enter an analog-to-digital converter working mode; the automatic test module is used for driving the automatic test module to send a preset waveform to the input port of the analog-to-digital converter; the to-be-tested chip is used for converting the analog signal input by the automatic test module into a digital signal and outputting the digital signal from a digital pin of the to-be-tested chip after the analog-to-digital converter is in a working state; the automatic test module is used for collecting and storing an output signal of the chip to be tested; and the automatic test module is used for reco</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAURuEsDqK-Q3yADEEhdJSiOHXqXkLytwaS3JhcBd9eER_A6XDgW4thRGPZXo2RpM1eJvCNvKT5czbSopiUD0tgG6Wj_ERl1K9EhONKOTiJ-yOUhMxbsZptbNj9uhH7y3nsrwqFJrRiHTJ46getjTl22nSnwz_mDSGbNtc</recordid><startdate>20240322</startdate><enddate>20240322</enddate><creator>QIAN YU</creator><creator>ZHENG SHAOLIANG</creator><scope>EVB</scope></search><sort><creationdate>20240322</creationdate><title>Test system and method of analog-to-digital converter and electronic equipment</title><author>QIAN YU ; ZHENG SHAOLIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117749179A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>QIAN YU</creatorcontrib><creatorcontrib>ZHENG SHAOLIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>QIAN YU</au><au>ZHENG SHAOLIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test system and method of analog-to-digital converter and electronic equipment</title><date>2024-03-22</date><risdate>2024</risdate><abstract>The invention discloses a test system and method for an analog-to-digital converter and electronic equipment, and relates to the technical field of test. The test system comprises an automatic test module and a to-be-tested chip, and the to-be-tested chip comprises an analog-to-digital converter. The automatic test module is used for electrifying the to-be-tested chip and configuring the to-be-tested chip to enter an analog-to-digital converter working mode; the automatic test module is used for driving the automatic test module to send a preset waveform to the input port of the analog-to-digital converter; the to-be-tested chip is used for converting the analog signal input by the automatic test module into a digital signal and outputting the digital signal from a digital pin of the to-be-tested chip after the analog-to-digital converter is in a working state; the automatic test module is used for collecting and storing an output signal of the chip to be tested; and the automatic test module is used for reco</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN117749179A |
source | esp@cenet |
subjects | BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY |
title | Test system and method of analog-to-digital converter and electronic equipment |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T19%3A52%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=QIAN%20YU&rft.date=2024-03-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117749179A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |