Scintillator decay time testing method based on waveform sampling
The invention discloses a scintillator decay time test method based on waveform sampling, and the method comprises the steps: enabling a scintillator to be coupled to an optical window of a photomultiplier tube disposed in a shielding box, employing a radioactive source to excite a sample, opening a...
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Format: | Patent |
Sprache: | chi ; eng |
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