Scintillator decay time testing method based on waveform sampling

The invention discloses a scintillator decay time test method based on waveform sampling, and the method comprises the steps: enabling a scintillator to be coupled to an optical window of a photomultiplier tube disposed in a shielding box, employing a radioactive source to excite a sample, opening a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUN JUN, GUO YU, GAO SONG, WANG ANLI, ZHAO CHANGYU, YANG FAN, RONG WENNA, ZHANG RUISEN
Format: Patent
Sprache:chi ; eng
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