Scintillator decay time testing method based on waveform sampling

The invention discloses a scintillator decay time test method based on waveform sampling, and the method comprises the steps: enabling a scintillator to be coupled to an optical window of a photomultiplier tube disposed in a shielding box, employing a radioactive source to excite a sample, opening a...

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Bibliographische Detailangaben
Hauptverfasser: SUN JUN, GUO YU, GAO SONG, WANG ANLI, ZHAO CHANGYU, YANG FAN, RONG WENNA, ZHANG RUISEN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a scintillator decay time test method based on waveform sampling, and the method comprises the steps: enabling a scintillator to be coupled to an optical window of a photomultiplier tube disposed in a shielding box, employing a radioactive source to excite a sample, opening an oscilloscope, automatically collecting at least 100 pulse signals, and transmitting the pulse signals to a control computer; processing and calculating the pulse waveform data acquired by the oscilloscope to obtain a decay time constant corresponding to single pulse data; the steps are repeatedly used for processing all the collected pulse data, and a decay time constant set is obtained; making a histogram by using the decay time constant set, wherein the data should be in normal distribution; and fitting the normal distribution by using a Gaussian function to obtain a decay time value corresponding to a peak value, wherein the decay time value is the decay time of the sample. The device can accurately test the d