Sample preparation method of non-compact porous poor conductor sample without influencing microscopic structure observation effect

The invention belongs to the technical field of material characterization sample preparation. The invention discloses a sample preparation method of a non-compact porous poor conductor sample without influencing the microscopic structure observation effect, which comprises the following steps: impregnating the non-compact porous poor conductor sample to be observed in an adhesive, then sequentially carrying out pressurization and curing treatment, grinding and polishing an observation surface, and finally sputtering a conductive layer, thereby obtaining the non-compact porous poor conductor sample. Obtaining an observation sample; the adhesive comprises the following raw materials in parts by mass: 60-80 parts of resin, 1-2 parts of acrylate modified silicone oil, 0.5-1.5 parts of a silane coupling agent and 50-100 parts of a solvent, and the viscosity value of the adhesive is adjusted to be less than or equal to 20 mPa.s (25 DEG C); the problems that the sample is difficult to cut into blocks due to insuffic