Stage insert, microscope system, apparatus, method and computer program
A stage insert is provided. The stage insert (150) includes a first region (152) for receiving a sample holder (154). Further, the stage insert 150 comprises a second region 162 comprising a first calibration target 164 for calibrating a first parameter of the microscope system. The stage insert 150...
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| creator | BELJAN, METTE RATSCHER, KAI |
| description | A stage insert is provided. The stage insert (150) includes a first region (152) for receiving a sample holder (154). Further, the stage insert 150 comprises a second region 162 comprising a first calibration target 164 for calibrating a first parameter of the microscope system. The stage insert 150 further comprises a third region 172 comprising a second calibration target 174 for calibrating a second parameter of the microscope system.
提供载物台插入件。载物台插入件150包括用于容纳样本支持器154的第一区域152。此外，载物台插入件150包括第二区域162，第二区域162包括用于校准显微镜系统的第一参数的第一校准目标164。载物台插入件150还包括第三区域172，第三区域172包括用于校准显微镜系统的第二参数的第二校准目标174。 |
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提供载物台插入件。载物台插入件150包括用于容纳样本支持器154的第一区域152。此外，载物台插入件150包括第二区域162，第二区域162包括用于校准显微镜系统的第一参数的第一校准目标164。载物台插入件150还包括第三区域172，第三区域172包括用于校准显微镜系统的第二参数的第二校准目标174。</description><language>chi ; eng</language><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240319&DB=EPODOC&CC=CN&NR=117724234A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240319&DB=EPODOC&CC=CN&NR=117724234A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BELJAN, METTE</creatorcontrib><creatorcontrib>RATSCHER, KAI</creatorcontrib><title>Stage insert, microscope system, apparatus, method and computer program</title><description>A stage insert is provided. The stage insert (150) includes a first region (152) for receiving a sample holder (154). Further, the stage insert 150 comprises a second region 162 comprising a first calibration target 164 for calibrating a first parameter of the microscope system. The stage insert 150 further comprises a third region 172 comprising a second calibration target 174 for calibrating a second parameter of the microscope system.
提供载物台插入件。载物台插入件150包括用于容纳样本支持器154的第一区域152。此外，载物台插入件150包括第二区域162，第二区域162包括用于校准显微镜系统的第一参数的第一校准目标164。载物台插入件150还包括第三区域172，第三区域172包括用于校准显微镜系统的第二参数的第二校准目标174。</description><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjkOwkAMQNFpKBBwB9OHIouUGkUsFQ30kTUxSSRmbNlOwe2h4ABUv3h_HS53x5FgzkbqBaQ5KltkIbC3OaUCUAQVfbGvkk88AOYBIidZnBREeVRM27B64sto9-sm7M-nR3c9kHBPJhgpk_fdrSzbtmqqujnW_zwfbEwz_g</recordid><startdate>20240319</startdate><enddate>20240319</enddate><creator>BELJAN, METTE</creator><creator>RATSCHER, KAI</creator><scope>EVB</scope></search><sort><creationdate>20240319</creationdate><title>Stage insert, microscope system, apparatus, method and computer program</title><author>BELJAN, METTE ; RATSCHER, KAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117724234A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>BELJAN, METTE</creatorcontrib><creatorcontrib>RATSCHER, KAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BELJAN, METTE</au><au>RATSCHER, KAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Stage insert, microscope system, apparatus, method and computer program</title><date>2024-03-19</date><risdate>2024</risdate><abstract>A stage insert is provided. The stage insert (150) includes a first region (152) for receiving a sample holder (154). Further, the stage insert 150 comprises a second region 162 comprising a first calibration target 164 for calibrating a first parameter of the microscope system. The stage insert 150 further comprises a third region 172 comprising a second calibration target 174 for calibrating a second parameter of the microscope system.
提供载物台插入件。载物台插入件150包括用于容纳样本支持器154的第一区域152。此外，载物台插入件150包括第二区域162，第二区域162包括用于校准显微镜系统的第一参数的第一校准目标164。载物台插入件150还包括第三区域172，第三区域172包括用于校准显微镜系统的第二参数的第二校准目标174。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS |
| title | Stage insert, microscope system, apparatus, method and computer program |
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