Method and system for testing time sequence output circuit and full loop of carrier rocket

The invention provides a carrier rocket time sequence output circuit and full loop test method and system, the test system comprises a control combination, a rocket cable and a resistance box, one end of the control combination is electrically connected with a constant current source, and the other...

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Hauptverfasser: RONG XUZHENG, SUN MINGWEI, LIU GUANGXUN, XIE CHEN, GAO WEIXI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a carrier rocket time sequence output circuit and full loop test method and system, the test system comprises a control combination, a rocket cable and a resistance box, one end of the control combination is electrically connected with a constant current source, and the other end of the control combination is electrically connected with the rocket cable; the resistor box is connected to a line of the rocket cable and serves as a passing assembly of the rocket cable; the control combination comprises a low-voltage test circuit and a time sequence acquisition circuit; one end of the low-voltage test circuit is connected with the constant current source, and the other end is connected with the time sequence circuit; the time sequence acquisition circuit is used for acquiring time sequence signals of each time sequence output circuit of a time sequence line. The device does not depend on ground equipment, rocket sequential circuit output condition checking and loop resistance testing are si