Chip grouping test method and system
The invention relates to the technical field of chip testing, and discloses a chip grouping testing method and system, and the method comprises the steps: selecting a main chip which can carry out normal chip communication from chips through a preset enumeration algorithm, and transmitting a first d...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of chip testing, and discloses a chip grouping testing method and system, and the method comprises the steps: selecting a main chip which can carry out normal chip communication from chips through a preset enumeration algorithm, and transmitting a first data communication protocol to peripheral chips of the main chip from the main chip, verifying whether the peripheral chip can perform normal chip communication with the main chip through the first data communication protocol; after a second data communication protocol is sent from the first-stage sub-chip to the second peripheral chip, constructing a multi-stage sub-chip of the first-stage sub-chip by using the second peripheral chip, and constructing an initial chip group of the chip by using the main chip, the first-stage sub-chip and the multi-stage sub-chip; judging whether a target chip capable of performing normal chip operation exists in the sub-node sub-tree or not; performing grouping first adjustment on t |
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