Clamp for Bar strip aging test

The invention provides a clamp for an aging test of a Bar strip, and relates to the technical field of wafer test. The clamp comprises a heat sink, at least one supporting part, a vertical probe card and at least one adjusting mechanism, the top of the heat sink is provided with an installation position used for installing a Bar strip, the supporting part is arranged above the heat sink, the vertical probe card is located on the supporting part, the vertical probe card is provided with a plurality of probes, and the adjusting mechanism is arranged on the supporting part. The vertical probe card is provided with a first position where the probe and the Bar strip are spaced by a preset distance and a second position where the vertical probe card is in contact with the Bar strip, and the adjusting mechanism is connected with the supporting component and the heat sink and used for adjusting the distance between the supporting component and the heat sink in the vertical direction so as to drive the vertical probe