Method and system for evaluating and testing performance of automatic multi-channel ADC (Analog to Digital Converter) chip

The invention discloses an automatic multichannel ADC chip performance evaluation test method comprising the following steps: obtaining a performance test data set of an ADC chip, and preprocessing the performance test data set; selecting a neural network model according to the performance test data set features, and training the neural network model to obtain a first neural network model; and evaluating the first neural network model by using the performance test data set to obtain a performance evaluation index of the first neural network model, and performing model adjustment on the first neural network model, so that the repeatability and accuracy of the test are improved, the test cost is greatly reduced, the market demand is met, and the method has commercial value. 本发明公开了一种自动化多通道ADC芯片性能评估测试方法，包括：获取ADC芯片的性能测试数据集，对所述性能测试数据集进行预处理；根据性能测试数据集特征选择神经网络模型，将神经网络模型进行训练，得到第一神经网络模型；将所述性能测试数据集对所述第一神经网络模型进行评估，得到所述第一神经网络模型的性能评估指标，并对第一神经网络模型进行模型调整，提高测试的可重复性和准确性，大大降低了测试成本，满足市场需求，具有商业价值。