Diagnosis method for internal loss mechanism of solar cell

The invention discloses a method for diagnosing an internal loss mechanism of a solar cell, and relates to the field of solar cells, the solar cell comprises an anode and a cathode, and an electron transport layer, an active layer and a hole transport layer are sequentially arranged between the cath...

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Hauptverfasser: XIA ZHAOSHENG, WU BO, LI YINGSONG, WANG GANG, CHEN ZHILIANG, SHA WEI, WANG LIHUA, REN XINGANG, WEI SHENGYANG, HUANG ZHIXIANG, PENG YONG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method for diagnosing an internal loss mechanism of a solar cell, and relates to the field of solar cells, the solar cell comprises an anode and a cathode, and an electron transport layer, an active layer and a hole transport layer are sequentially arranged between the cathode and the anode from top to bottom; the diagnosis method comprises the following steps: S1, modeling a solar cell by using a solar cell multi-physical field simulation platform, and simulating JV curve charts of four types of solar cells A, B, C and D by regulating and controlling active layer body defects, surface defects and voltage scanning rates of the solar cell; s2, performing forward voltage scanning on the solar cell to obtain a forward JV curve graph; carrying out reverse voltage scanning to obtain a reverse JV curve graph, and judging which one of A, B, C and D types the JV curve graph belongs to according to the obtained forward and reverse curve graphs; according to the method, analysis is carried out