Abnormality determination method and device, electronic equipment and storage medium
The embodiment of the invention provides an exception determination method and device, equipment and a medium. The method comprises the following steps: in a single crystal straight pulling process, acquiring at least two single crystal rod images within a preset duration of an equal-diameter stage,...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides an exception determination method and device, equipment and a medium. The method comprises the following steps: in a single crystal straight pulling process, acquiring at least two single crystal rod images within a preset duration of an equal-diameter stage, detecting a bright ring area in each single crystal rod image, and determining an abnormal condition of a single crystal rod according to a coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images, according to the method, the unusual condition of the single crystal rod is found by analyzing the growth change of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the multiple single crystal rod images, so that the abnormal working hours after the unusual condition are reduced, the per unit yield is further improved, the risk that the rod falls to smash a crucible when arc scratching is serious is avoided, and better gua |
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