Electronic component temperature characteristic testing method

According to the electronic component temperature characteristic testing method, testing is carried out based on a testing device, and the testing device comprises a testing seat, a clamping jig and a control mechanism. The testing seat comprises a testing seat body, a testing plate arranged on the testing seat body, a fixing block which is arranged on the testing plate and is used for fixing the clamping jig, and a plurality of first contact probes which are arranged on the fixing block at intervals and are connected with the testing plate; the clamping jig is used for installing and fixing the capacitor and comprises a clamping assembly used for installing and fixing the capacitor, a positioning block arranged at the bottom of the clamping assembly and a plurality of second contact probes arranged in the positioning block at intervals and connected with the clamping assembly. The second contact probe is in contact connection with the corresponding first contact probe; the control mechanism is connected with