Image acquisition device calibration method, device and equipment
The invention provides an image acquisition device calibration method, device and equipment, and relates to the field of computers. In the method, a first image acquisition device on first equipment determines a first external parameter by acquiring a first image set and a second image set, and the...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides an image acquisition device calibration method, device and equipment, and relates to the field of computers. In the method, a first image acquisition device on first equipment determines a first external parameter by acquiring a first image set and a second image set, and the first external parameter is an external parameter of the first image acquisition device relative to the first equipment; and according to the external parameters of the first equipment and the condition that the first pose transformation is pose transformation between the coordinate system of the second image acquisition device and the coordinate system of the first image acquisition device, determining the external parameters of the second image acquisition device relative to the first equipment. The method can be suitable for calibrating the image acquisition device without the common view field.
本申请提供一种图像采集装置标定方法、装置和设备,涉及计算机领域。在该方法中,第一设备上的第一图像采集装置通过获取第一图像集合和第二图像集合,确定第一外参,第一外参为第一图像采集装置相对于所述第一设备的外参;根据第一设备的外参、以及第一位 |
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