Method for measuring data of measuring device influenced by hysteretic physical quantity

The invention relates to a data measurement method of a measurement device influenced by a hysteresis physical quantity, the measurement device comprises a sensor used for measuring a physical quantity to be measured, the method comprises the following steps: obtaining the physical quantity to be me...

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Bibliographische Detailangaben
Hauptverfasser: FU RUOWEI, ZHAO YIFAN, LIU YANLIN, SHI PEIXIN, FU BINGRUI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a data measurement method of a measurement device influenced by a hysteresis physical quantity, the measurement device comprises a sensor used for measuring a physical quantity to be measured, the method comprises the following steps: obtaining the physical quantity to be measured, and the physical quantity to be measured at least comprises one hysteresis physical quantity; obtaining first measurement data based on the to-be-measured physical quantity; the first measurement data are input into a filter, second measurement data are obtained, and the filter is set based on preset response time. According to the technical scheme of the invention, the filtering technology is introduced, so that the performance of the measurement system in the measurement of processing the hysteresis physical quantity is remarkably improved. The hysteresis effect of the data is effectively reduced, so that the response speed of the system to the change of the actual physical quantity is improved. And the a