Sampling circuit system
The invention relates to a sampling circuit system. The sample and hold circuit includes: an input node to which an input voltage signal is configured to be supplied; a first reference voltage node to which a first reference voltage potential is configured to be provided; a sampling capacitor circui...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a sampling circuit system. The sample and hold circuit includes: an input node to which an input voltage signal is configured to be supplied; a first reference voltage node to which a first reference voltage potential is configured to be provided; a sampling capacitor circuit; a sampling switch transistor circuit connected between the input node and the sampling capacitor circuit; a first common mode switching transistor circuit connected between the sampling capacitor circuit and a first reference voltage node; a signal bootstrap circuit configured to generate a first control voltage based on the clock signal and configured to control the sampling switch transistor circuit based on the first control voltage, the first control voltage varying according to a level of the input voltage signal; and a static bootstrap circuit configured to generate a second control voltage based on the clock signal and configured to control the first common mode switching transistor circuit based on the s |
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