Embedded storage chip aging test system and test method based on Android system

The invention provides an embedded storage chip aging test system and method based on an Android system to overcome the defects that a traditional test mode is limited to a computer, needs to be switched through a USB (Universal Serial Bus) and cannot be customized, and is characterized in that the test system comprises a PC (Personal Computer) end, an Android test platform and a tested embedded storage chip; the PC end is used for compiling a test script and a life aging test program; the tested embedded storage chip is installed on the Android test platform, and the Android test platform is used for adjusting parameters of a test script and controlling reading and writing of the embedded storage chip. 本发明提供了一种基于Android系统的嵌入式存储芯片老化测试系统和测试方法，以改善传统测试模式限制于电脑、需要通过USB转接、无法客制化的缺点，其特征在于：所述测试系统包括PC端、Android测试平台和被测嵌入式存储芯片；所述PC端用于编译测试脚本和寿命老化测试程序；所述被测嵌入式存储芯片安装在Android测试平台上，所述Android测试平台用于调整测试脚本的参数和控制嵌入式存储芯片的读写。