Analog-to-digital converter calibration method
The invention relates to an analog-to-digital converter calibration method which comprises the following steps: 1) before an analog-to-digital converter starts to run, performing initialization operation, and preparing a calibration process; 2) setting the number modulus of channels in the time cros...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to an analog-to-digital converter calibration method which comprises the following steps: 1) before an analog-to-digital converter starts to run, performing initialization operation, and preparing a calibration process; 2) setting the number modulus of channels in the time cross sampling ADC, and setting a conversion model of an analog-to-digital converter; 3) calculating offset and gain error calibration parameters of the first channel; 4) calculating offset and gain error calibration parameters of other channels; 5) calibrating the digital quantity of each channel; and 6) synthesizing the data to obtain a final digital output quantity. According to the analog-to-digital converter calibration method, a scheme that other channels are calibrated to one channel is adopted, the offset and gain error parameters of each channel relative to the first channel are firstly calculated, and then digital quantity calibration is performed on each channel, so that the influence of the offset error and |
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