Calibration data storage and calling method for improving precision

The invention discloses a calibration data storage and calling method for improving precision, which belongs to the technical field of chip testing and specifically comprises the following steps: debugging a channel board, generating an exclusive ID and writing the exclusive ID into an EEPROM (Electrically Erasable Programmable Read-Only Memory); selecting a corresponding signal, calculating offset and gain parameters, and storing and calibrating the ADC; performing DC calibration on the special test chip, and storing data in an EWS and a channel plate; during testing, the channel board card ID of each SLOT is read, calibration data in the EWS are called according to the relation between the SLOT and the ID, and an issuing value is calculated and sent into the channel board; the second programmable logic device distributes the control data to the special test chip; in a test, the second programmable logic device reads calibration data from the calibration data storage device according to a current test item a