Semiconductor device with syndrome generator

The invention relates to a semiconductor device with a syndrome generator. An apparatus comprising: an array of memory cells; an I/O terminal supplied with original write data in normal operation; a compression logic circuit configured to generate compressed test data in a test operation based on test read data read from the array of memory cells; and a syndrome generator configured to generate a first syndrome based on the raw write data in the normal operation and a second syndrome based on the compressed test data in the test operation. 本公开涉及具有校验子产生器的半导体装置。一种设备，其包含：存储器单元阵列；I/O端子，其在正常操作中经供应有原始写入数据；压缩逻辑电路，其经配置以基于从所述存储器单元阵列读取的测试读取数据而在测试操作中产生经压缩测试数据；及校验子产生器，其经配置以基于所述正常操作中的所述原始写入数据来产生第一校验子，且基于所述测试操作中的所述经压缩测试数据来产生第二校验子。